納米技術(shù)中的顯微學(xué)手冊(cè)Ⅱ內(nèi)容簡(jiǎn)介

1 Confocal Scanning Optical Microscopy and Nanotechnology

1.1 Introduction

1.2 The Confocal Microscope

1.2.1 Principles of Confocal Microscopy

1.2.2 Instrumentation

1.2.3 Techniques for Improving Imaging of Nanoscale Materials

1.3 Applications to Nanotechnology

1.3.1 Three Dimensional Systems

1.3.2 Two Dimensional Systems

1.3.3 One Dimensional Systems

1.3.4 Zero Dimensional Systems

1.4 Summary and Future Perspectives

References

2 Scanning Near Field Optical Microscopy in Nanosciences

2.1 Scanning Near Field Optical Microscopy and Nanotechnology

2.2 Basic Concepts

2.3 Instrumentation

2.3.1 Probe Fabrication

2.3.2 Flexibility of Near Field Measurements

2.4 Applications in Nanoscience

2.4.1 Fluorescence Microscopy

2.4.2 Raman Microscopy

2.4.3 Plasmonic and Photonic Nanostructures

2.4.4 Nanolithography

2.4.5 Semiconductors

2.5 Perspectives

References

3 Scanning Tunneling Microscopy

3.1 Basic Principles of Scanning Tunneling Microscopy

3.1.1 Electronic Tunneling

3.1.2 Scanning Tunneling Microscope

3.2 Surface Structure Determination by Scanning Tunneling Microscopy

3.2.1 Semiconductor Surfaces

3.2.2 Metal Surfaces

3.2.3 Insulator Surfaces

3.2.4 Nanotubes and Nanowires

3.2.5 Surface and Subsurface Dynamic Processes

3.3 Scanning Tunneling Spectroscopies

3.3.1 Scanning Tunneling Spectroscopy

3.3.2 Inelastic Tunneling Spectroscopy

3.3.3 Local Work Function Measurement

3.4 STM Based Atomic Manipulation

3.4.1 Manipulation of Single atoms

3.4.2 STM Induced Chemical Reaction at Tip

3.5 Recent Developments

3.5.1 Spin Polarized STM

3.5.2 Ultra Low Temperature STM

3.5.3 Dual Tip STM

3.5.4 Variable Temperature Fast Scanning STM

References

4 Visualization of Nanostructures with Atomic Force Microscopy

4.1 Introductory Remarks

4.2 Basics of Atomic Force Microscopy

4.2.1 Main Principle and Components of Atomic Force Microscope

4.2.2 Operational Modes, Optimization of the Experiment and Image Resolution

4.2.3 Imaging in Various Environments and at Different Temperatures

4.3 Imaging of Macromolecules and Their Self Assemblies

4.3.1 Visualization of Single Polymer Chains

4.3.2 Alkanes, Polyethylene and Fluoroalkanes

4.4 Studies of Heterogeneous Systems

4.4.1 Semicrystalline Polymers

4.4.2 Block Copolymers

4.4.3 Polymer Blends and Nanocomposites

4.5 Concluding Remarks

References

5 Scanning Probe Microscopy for Nanoscale Manipulation and Patterning

5.1 Introduction

5.1.1 Nanoscale Toolbox for Nanotechnologists

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6 Scanning Thermal and Thermoelectric Microscopy

7 Imaging Secondary Ion Mass Spectrometry

8 Atom Probe Tomography

9 Focused Ion Beam System—a Multifunctional Tool for Nanotechnology

10 Electron Beam Lithography

Index 2100433B

涵蓋的范圍包括共聚焦光學(xué)顯微鏡、掃描近場(chǎng)光學(xué)顯微鏡、各種掃描探針顯微術(shù)、離子顯微鏡等，共有10個(gè)專題。本書力圖使讀者對(duì)所敘述的方法有一個(gè)概念上的理解，而不是只停留在對(duì)理論的堆砌上。在每一個(gè)專題里，都會(huì)敘述相關(guān)的實(shí)例及其應(yīng)用并加以討論，使讀者對(duì)每種顯微技術(shù)都能明了和理解；還會(huì)進(jìn)一步展示各章之間的內(nèi)在聯(lián)系，表明每一種技術(shù)如何在綜合性的、復(fù)雜的測(cè)試中各自扮演獨(dú)特的角色，解決具體的問(wèn)題。