有機(jī)薄膜的表征

Preface to the Reissue of the Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Organic Thin Films

Preface

Contributors

PART Ⅰ： PREPARATION AND MATERIALS LANGMUIR—BLODGETT FILMS

1.1 Introduction

1.2 L—B Films ofLong—Chain Compounds

FattyAcids

Amines

Other Long—Chain Compounds

1.3 Cyclic Compounds and Chromophores

1.4 Polymers and Proteins

1.5 Polymerization In Situ

1.6 Alternation Films （Superlattices）

1.7 PotentiaIApplications

SELF—ASSEMBLED MONOIAYERS

2.1 Introduction

2.2 Monolayers of Fatty Acids

2.3 Monolayers of Organosilicon Derivatives

2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces

2.5 Self—Assembled Monolayers Containing Aromatic Groups

2.6 Conclusions

PARTⅡ： ANALYSIS OF FILM AND SURFACEPROPERTIES

SPECTROSCOPIC ELLIPSOMETRY

3.1 Introduction and Overview

3.2 Theory of Ellipsometry

3.3 Instrumentation

3.4 Determination of Optical Properties

Analysis of Single Eliipsometric Spectra： Direct Inversion Methods

Analysis of Single Ellipsometric Spectra： Least— Squares Regression Analysis Method

Analysis of Multiple Ellipsometric Spectra

3.5 Determination of Thin Film Structure

Thickness Determination for Monolayers

Microstructural Evolution in Thick Film Growth

3.6 Future Prospects

INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS

4.1 Introduction

Specific Needs for Characterizing Organic Thin Films

General Prinaples and Capabilities of Infrared Spectroscopy for Surface and Thin Film Analysis

4.2 Quantitative Aspects

Spectroscopiclntensities

Electromagnetic Fields in Thin Film Structures

4.3 The Infrared Spectroscopic Experiment

General Instrumentation

Experimental Modes

Additional Aspects

4.4 Examples of Applications

Self—Assembled Monolayers on Gold by External Reflection

Octadecylsiloxane Monolayers on SiO2 byTransmission

Langmuir—Blodgett Films on Nonmetallic Substrates by External Reflection

RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS

5.1 Introduction

5.2 FundamentalsofRaman Spectroscopy

5.3 InstrumentaIConsiderations

5.4 Raman Spectroscopic Approaches for the Characterization ofOrganicThin Films

Integrated OpticaIWaveguide Raman Spectroscopy （IOWRS）

Total Internal Reflection Raman Spectroscopy

Surface Enhanced Raman Scattering

Normal Raman Spectroscopy

Resonance Raman Spectroscopy

Plasmon Surface Polariton Enhanced Raman Spectroscopy

FourierTransform Raman Spectroscopy

Waveguide Surface Coherent Anti—Stokes Raman Spectroscopy（WSCARS）

5.5 Selected Examples of Thin Film Analyses

Raman Spectral Characterization of Langmuir—Blodgett Layers of Arachidate and Stearate Salts

Raman Spectral Characterization of Self—Assembled Monolayers of Alkanethiols on Metals

Surface Enhanced Resonance Raman Spectral Characterization of Langmuir—Blodgett Layers of Phthalocyanines

5.6 Prospects for Raman Spectroscopic Characterization of Thin Films

SURFACE POTENTIAL

6.1 Introduction

6.2 Origins of the Contact Potential Difference and Surface Potential

The Work Function

Contact Potential Difference and Surface Potential

Surface Potential Changes Induced by Adsorbates

6.3 Measurement of Surface Potential

CapacitanceTechniques

Ionizing—ProbeTechnique

6.4 Surface Potentials of OrganicThin Films

Air—Water Interface： Surface Potential of Langmuir Mono— layers

Air—Solidlnterface： Surface Potential of L—B and Related Films

6.5 Conclusions

X—RAY DIFFRACTION

7.1 Introduction

7.2 Basic Principles

7.3 StructureNormalto Film Plane

7.4 Structure Within the Film Plane

7.5 Summary

HIGH RESOLUTION EELS STUDIES OF ORGANIC THIN FILMS AND SURFACES

8.1 Introduction

8.2 TheScatteringMechanism

DipoleScattering

Impact Scattering

Resonance Scattering

8.3 TheSpectrometer

8.4 EELS Versus Other Techniques： Advantages and Disadvantages

8.5 Examples

ResolutionEnhancement

Linearity

Depth Sensitivity

Molecular Orientation

Local Versus Long—Range lnteractions

SurfaceS egregation

8.6 Conclusions

WETTING

9.1 Introduction

9.2 ContactAngles

9.3 Techniques for Contact Angle Measurements

Axisymmetric Drop ShapeAnalysis—Profile （ADSA—P）

Axisymmetric Drop Shape Analysis—Contact Diameter （ADSA—CD）

Capillary Rise Technique

9.4 Phase Rule for Moderately Curved Surface Systems

9.5 Equation of State forInterfacialTensions of Solid— Liquid Systems

9.6 Drop Size Dependence of Contact Angle and Line Tension

9.7 Contact Angles in the Presence ofa Thin Liquid Film

9.8 Effects ofElastic Liquid—Vaporlnterfaces on Wetting

SECONDARY ION MASS SPECTROMETRY AS APPLIED TO THIN ORGANIC AND POLYMERIC FILMS

10.1 Introduction and Background

Overview of the SIMS Method and Experiment

Ion FormationMechanisms

Comparisons to Other Surface Analysis Techniques

The Motivation for Thin Organic Films as Model Systems

10.2 Qualitative Information： Mechanisms ofSecondary Molecularlon Formation

Structure—Ion Formation Relationships

Applications to Self—Assembled Film Chemistry

10.3 The Study ofSampling Depth in the SIMS Experiment

10.4 Quantitationin SIMS

Development of Quantitation Methods

Applicationof Quantitative Schemes to Thin Film Chemistry

10.5 ImagingApplications

10.6 Summary and Prospects

X—RAY PHOTOELECTRON SPECTROSCOPY OF ORGANIC THIN FILMS

11.1 Introduction

11.2 Experimental Considerations

11.3 Binding Energy Shifts

11.4 XPS of Molten Films

11.5 Angular Dependent XPS

11.6 ETOAXPS of Self—Assembled Monolayers

11.7 Conclusions

MOLECUlAR ORIENTATION IN THIN FILMS AS PROBED BY OPTICAL SECOND HARMONIC GENERATION

12.1 Introduction

12.2 Experimental Considerations

12.3 Molecular Nonlinear Polarizabiliry Calculation

12.4 Measurements of the Surface Nonlinear Susceptibility

12.5 Molecular Orientation Calculation

Casel：βzzzonly

Case2：βzxxonly

Case3： βxxz（=βxzx）only

Case4：βzzz and βzxx

Case5： βzxx and βxxz（=βxzx）

12.6 Absolute Molecular Orientation Measurements

12.7 Summary and Conclusions

APPENDIX： TECHNIQUE SUMMARIES

I Auger Electron Spectroscopy（AES）

2 DynamicSecondarylon Mass Spectrometry （DynamicSIMS） 252

3 FourierTransformlnfraredSpectroscopy（FTIR） 253

4 High—Resolution Electron Energy Loss Spectroscopy （HREELS）

5 Low—Energy Electron Diffraction（LEED）

6 Raman Spectroscopy

7 Scanning Electron Microscopy（SEM）

8 Scanning Tunneling Microscopy（STM） and Scanning Force Microscopy （SFM）

9 Static Secondarylon Mass Spectrometry （Static SIMS）

10 Transmission Electron Microscopy（TEM）

11 Variable—Angle Spectroscopic Ellipsometry（VASE）

12 X—Ray Diffraction XRD）

13 X—Ray Fluorescence（XRF）

14 X—Ray Photoelectron Spectroscopy（XPS）

Index 2100433B

相關(guān)領(lǐng)域的教學(xué)、研究、技術(shù)人員以及研究生和高年級本科生參考書。

可測定多層薄膜和基片的折射率、吸收系數(shù)和厚度，可全自動、可同時測定透過光譜和反射光譜，入射光角度可從0°到90°連續(xù)改變。 2100433B

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光譜分辨率:1nm或2nm （可選）;光源:150W 氙弧燈;樣品尺寸:10×10mm到200×250mm;層數(shù):至多5層，兩個未知參數(shù);薄膜厚度范圍:1nm到25um，取決于角度、偏振和波長。